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A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films

机译：一种新的带状磁阻抗宽带测量方法和薄膜

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摘要

A novel broad-band measurement method of the MI in thin films and ribbons ispresented. It is based on the automated measurement of the reflectioncoefficient of a cell loaded with the sample. Illustrative results obtainedwith a permalloy multilayer thin film are presented and discussed.

机译：提出了一种新颖的宽带测量薄膜和色带中MI的方法。它基于对装有样品的样品池的反射系数的自动测量。介绍并讨论了用坡莫合金多层薄膜获得的说明性结果。

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Fessant, A.; Gieraltowski, J.; Tannous, C.; Valenzuela, R.;
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年度 2003
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正文语种 {"code":"en","name":"English","id":9}
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A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films

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